Computer Vision And Pattern Analysis Laboratory Home Page  Home
People  People
Publications  Publications
Publications  Databases
Contact Information  Contact
Supported Research Projects  Supported Research Projects
Research Activites  Research Activites
Research Groups
SPIS - Signal Processing and Information Systems Lab.SPIS - Signal Processing and Information Systems Lab.
Medical Vision and Analysis Group  Medical Research Activities
Biometrics Research Group  Biometrics Research Group
SPIS - Signal Processing and Information Systems Lab.MISAM - Machine Intelligence for Speech Audio and Multimedia.
Knowledge Base
  Paper Library
Tekstil kumaş imgelerinde dalgacık dönüşümleri ve bağımsız bileşen analizi ile hata denetimi (in Turkish)
Authors: A. Serdaroğlu, A. Ertüzün, A. Erçil
Published in: SIU 2005
Publication year: 2005
Abstract: Textile Fabric Defect Detection with Wavelet and Independent Component Analysis
In this work, a new model that combines the concepts of wavelet transformation and independent component analysis (ICA) is developed for the purpose of defect detection in textile images. In previous works, it has been shown that reduction of the texture of the textile image by preprocessing has increased the performance of the system. Based on this observation, in present work independent component analysis is aimed to be applued on the subband images. The feature vector of a subwindow of the defect-free image in order to make a decision. This decision is based on a Euclidean distance classifier. The performance increase that results using wavelet transformation prior to independent component analysis has been discussed in detail.
  download full paper

Home Back